Reports of the element silicon – a king pin of the electronics industry for the past five decades – in the topical form of a 2D material have animated the community. Yet the discovery is not without dispute. While studies of multilayer ‘silicene’ report many intriguing properties, debate has flared over the ability to realize the multilayered material at all. Recently released x-ray diffraction measurements now claim to have confirmed the presence of multilayered silicene, and highlight the important role of growth temperatures to achieve the pure silicene phase…..
http://nanotechweb.org/cws/article/tech/66365
